I was thinking that its a time for the new 50 cycles (for some of us it is like waiting for new episode of a good serial).docware wrote: ↑Nov 05 2019 3:43pmI have some new data from cycling. Panasonic PF at 250 cycles keeps trend both in capacity decreasing and DCIR rise. LG M36 continue with very slow capacity decline. M36 DCIR got reverse trend, at 250 cycles is lower than 150 and 200 cycles. Can´t exclude my measuring error, trying to find out what is happening. Sanyo GA capacity decreasing trend continue, however DCIR rise stopped.
My comments are: Do not worry about DCIR fluctuations, it is still in cca 5% error range which is excelent result for the electrochemical cell. I was telling you that I admire that you are still performing precision measurement on very unstable process We old pals are just following the trend of growth or more expressively a White fang pisses on some fluctuation. So do not worry the GA will continue with DCIR rise trend course where the M36 stay still.
I was wondering what has happened? It was a "Comm Error" issue? I suppose that you know that EBX software automatically saves running data into its folder (.bk1 = .dat and .bk0 = .run files) and so after the software crashes you can in most cases continue in measurement without significant loss of data? After the crash just start a new EBX Software instance (i usually also restart the PC), then connect to the tester and then click right mouse on some channel and choose "Channel or device continue". Your EBX tester must be on the same comm port as before crash. EB Software for single channel testers does not have this function.docware wrote: ↑Nov 05 2019 3:43pmUnfortunately thanks to today´s dropout of the ZKETECH control software I lost lot of Samsung 29E last batch data (cca 36 cycles) and also some Panasonic PF and Sanyo GA data. At least I measured PF DCIR and continue cycling. PF keeps DCIR still the same around 29,3 miliohm.